wafer test/probe test
同义词释义
- 1)wafer test/probe test,晶圆测试/探针测试2)Wafer Probe,晶圆测试探针3)wafer probing,晶圆测试,晶圆探测4)test probe,测试探针5)Wafersort,晶圆测试6)Probe test node,探针测试点
用法例句
Wafer Probe Acquires a New Importance in Testing;
晶圆测试探针新的测试价值
Attach test leads to pins 1 and 2 and note ohmmeter reading.
把测试探针连接到插头1和2,并记下欧姆表读数。
Attach test leads to pins 5 and 6 and note ohmmeter reading.
把测试探针连接到插头5和6,并记下欧姆表读数。
General specification for probe tester
GB/T15394-1994多探针测试台通用技术条件
Researching and Developing of Intelligent Four-Probe Resistivity Meter s;
智能四探针电阻率测试仪研究及开发
The Study of Four-Probe Measurement System Combining with Image Analysis;
结合图像分析的四探针测试系统研究
TESTING AND DISCUSSION ON DRAPE OF CELLULOSE FIBER KNITTED FABRIC
纤维素纤维针织物悬垂性测试与探讨
Development of a four-point probe measuring system based on MCU-51
基于单片机的四探针测试系统的研制
THERE is the nail test, in which a team of engineers drives a large metal nail through a battery cell to see if it explodes.
在一项探针测试中,工程师将金属探针穿过蓄电池来看是否会爆炸。
Study on Fluorone Reageant-(VI) as Spectral Probe for Protein Determination;
荧光酮类试剂—钼(VI)光谱探针测定蛋白质的研究
Applied Research on Built-In-Self-Probe-Test in Object-Oriented Software Testing;
面向对象软件内嵌探针测试的应用研究
The Application of Image Identify in the Micro-Area Four-Probe Testing System;
图像识别在微区四探针测试技术中的应用
Wires running from the tester interface to the probes carry test signals back and forth.
连接测试设备和探针的导线来回的传递测试信号。
Test engineers refer to spring-loaded probes as" nails" and refer to a fixture using spring-loaded probes as a" bed-of-nails" fixture.
测试工程师把带有弹簧的探针当作“钉子”,把带有这种探针的固定装置当作“针床”。
The doctor sounded the bladder.
医生以探针探测膀胱。
Most in-circuit test fixtures use spring-loaded probes and are vacuum actuated.
很多在线测试固定装置是带有弹簧的探针或者采用真空启动的。
Predictions with the Reynolds stress model (RSM) were in reasonable agreement with experimental results measured by intelligent five-hole probe.
计算结果与用五孔探针测试的气相流场实验结果吻合很好。
Study on the Four Point Probe Technique for the Sheet Resistance Measurement of the Micro-Area Integrating with Image Analysis;
结合图像分析的微区薄层电阻四探针测试技术研究
Study on Silicon Sheet s Micro-Area s Resistance Stability Measured by Four Point Probe Method;
用四探针法测试硅片微区薄层电阻的稳定性研究
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